TELLUS Basic – Description
TELLUS Basic is a desktop powder diffractometer that meets the highest requirements for this class of instruments and even exceeds expectations in some ways.
TELLUS Basic equipped with the most advanced DECTRIS* MYTHEN2 R 1D detector what drastically speed up the measurement. Express analysis can be carried out in a few minutes while maintaining the quality of the data.
The 100% quantum efficiency of the detector and its feature to accumulate the signal keeping low noise level make it possible to collect the highest quality data. That is why this powder diffractometer can analyze even very small amounts of sample.
With the high resolution of the detector and the precise positioning of goniometer the accuracy better than +/- 0.01° (2Ө) over the full angular range is achieved.
The software interface with predefined experimental scenarios makes the measurement process clear even for new users, though the experts in XRD can create their own protocol. The software for analysis is based on the advanced analytical methods to make the quantitative and qualitative analysis of samples more precise.
Both the detector and the X-ray source of a powder diffractometer have a long lifetime, what significantly reduces the maintenance costs and saves the budget.
Comparison with other TELLUS models
| Feature / Model | TELLUS BASIC | TELLUS PRO | TELLUS INDUSTRY | TELLUS HR |
|---|---|---|---|---|
| Target Audience | Education, research, routine QC labs | Research, high-tech industry | Cement, mining, metallurgy, process control | Advanced R&D, semiconductor, epitaxy |
| Goniometer Radius | 150 mm | Variable, 150–210 mm | 150 mm fixed industrial mount | High-precision 240 mm |
| Scanning Range (2Ө) | –6° to +154° | –12° to +160° | –6° to +154° | –20° to +170° |
| Thin-Film Analysis | Limited | GIXRD, XRR, texture analysis | Not required | HRXRD, RSM, XRR, epitaxial film analysis |
| Residual Stress & Texture | Not available | Available | Not required | High-resolution residual stress & texture mapping |
| Sample Stage | Fixed with optional rotation | Two-axis Z-Phi stage | Automated loading carousel or batch tray | Five-axis motorized goniometer stage |
| Accessories | Basic powder holders | Goebel mirror, parallel plate collimator, capillary stage | Integrated autosampler, dust-protected chassis, LIMS-ready interface | High-res optics, beam conditioners, advanced sample environment |
| X-ray Generator | 40 kV / 15 mA (600 W) | 40 kV / 30 mA (1200 W) | 40 kV / 15–30 mA (up to 1200 W) | High-stability 3 kW system (optional) |
Software package
- TELLUSCon
- Specialized Software
- COD, PDF-2 databases
Applications:
- Pharmaceutical and cosmetics industries
- Forensic expertise
- Cement industry
- Oil-gas exploration
- Geology and mining
- Chemical industry
- Automotive industry
- Science and education
- And others…. (archeology, gemology, food industry etc.)
Key features
Theta/Theta geometry
High effective HPC DECTRIS detector
Fast measurements
High signal/noise ratio
Long lifetime X-ray tube and detector
No external cooling
Video
Technical data
Details
| Tube power | 600/300 W (on request) |
| Target | Cu (Cr, Fe, Co, Mo – optional) |
| Cooling system | Internal water cooling: closed-circuit |
| Goniometer | θ-θ vertical, radius 150 mm |
| Scanning range | -6° ÷ +154° (2Ө) |
| Minimal step | 0.0003° (2Ө) |
| Positioning accuracy | +/- 0.01° (2Ө) |
| Scanning speed | 0.01-600°/min |
Peripherals
| Interface | USB/Ethernet |
| Personal computer | PC with OS Windows |
Dimensions
| Overall dimensions | |
|---|---|
| Width | 700 mm |
| Depth | 700 mm |
| Height | 860 mm |
| Weight (maximum) | 115 kg |
|---|
Technical
| Tube power | 600/300 W (on request) |
| Target | Cu (Cr, Fe, Co, Mo – optional) |
| Cooling system | Internal water cooling: closed-circuit |
| Goniometer | θ-θ vertical, radius 5.9″ |
| Scanning range | -6° ÷ +154° (2Ө) |
| Minimal step | 0.0003° (2Ө) |
| Positioning accuracy | +/- 0.01° (2Ө) |
| Scanning speed | 0.01-600°/min |
Peripherals
| Interface | USB/Ethernet |
| Personal computer | PC with OS Windows |
Dimensions
| Overall dimensions | |
|---|---|
| Width | 27.5″ |
| Depth | 27.5″ |
| Height | 33.8″ |
| Weight (maximum) | 253 lbs |
|---|
Accessories
Designed to accommodate specimens up to 25 mm high, 50 to 150 mm long and up to 30 mm wide
Designed to reduce the background level associated with the scattering of a direct beam of radiation
Allows to load up to 8 samples for measurements with the ability to control the speed of rotation of the sample
Rotating sample stage used to increase the accuracy of quantitative analysis
Related links
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