Divergence slit for an incident beam

Divergence slit for an incident beam
LOT #O1002 | Divergence slit forming a precise low-divergence X-ray beam for high-resolution diffraction.
Divergence slit for an incident beam

Description

The divergence slit is a precision optical component
designed to form a well-defined, low-divergence X-ray
beam with a small cross-section. By restricting the
angular spread of the incident beam, it enables
high-resolution diffraction measurements while
maintaining optimal intensity.

Key Functions:

  • Controls horizontal beam divergence (typically 0.1° to 2° selectable)
  • Defines the irradiated area on the sample surface
  • Reduces air scattering and parasitic radiation
  • Improves peak-to-background ratio in diffraction patterns

Distance between plates:

1.0 mm

Item No. 03.02.100-06

1.2 mm

Item No. 03.02.100-07

1.6 mm

Item No. 03.02.100-08

2.0 mm

Item No. 03.02.100-09

3.0 mm

Item No. 03.02.100-10

4.0 mm

Item No. 03.02.100-11

6.0 mm

Item No. 03.02.100-12

8.0 mm

Item No. 03.02.100-13

9.0 mm

Item No. 03.02.100-14

Others

On request

Features:

  • Plates material: tantalum, brass
  • Distance between plates: 1 to 9 mm
  • Installed on the X-ray source assembly arm
  • Simple installation and replacement

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