Description
A non-ambient high-temperature chamber for X-ray diffraction analysis is a cutting-edge
tool engineered to investigate the structural properties of materials under controlled thermal
conditions.
This advanced chamber allows researchers to study the evolution of crystalline structures as a function of temperature, offering critical insights into
material behavior, stability, and performance. Such analyses are invaluable for understanding phase transitions, thermal expansion, and degradation
mechanisms, which are essential for optimizing material design and application.
The chamber supports the fine-tuning of synthesis processes for novel materials, enabling the creation of advanced ceramics, polymers, and
composites with tailored properties.
Equipped with precise temperature control and compatibility with most X-ray diffractometers, the chamber ensures accurate and reproducible
results. Its robust design allows for operation at elevated temperatures while maintaining sample integrity and measurement precision. By integrating
this tool into their research, scientists can unlock new possibilities in material science, driving innovation and technological advancements across
multiple fields.
Features:
- Heating from room temperature to 600°
- Measurement atmosphere: vacuum (10⁻¹ bar), air, inert gas
- High-precision temperature sensor
- Sample holder material: Ni
- Sample size: 16×14 mm
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