Description
The two-axis sample stage is an essential accessory designed to precisely align the
sample surface with the center of the primary X-ray beam in automatic mode, ensuring
optimal measurement accuracy and reproducibility.
This advanced stage is indispensable for a variety of specialized analytical techniques, including:
- Grazing Incidence X-ray Diffractometry (GIXRD): Perfect for thin-film analysis, allowing precise control of the incident angle to probe surface and interface structures.
- X-ray Reflectometry (XRR): Enables detailed characterization of thin films and multilayers by measuring reflectivity as a function of the incident angle.
- Sin² Residual Stress Determination: Facilitates accurate stress analysis in materials by aligning the sample at multiple angles for reliable stress calculations.
- Texture Measurement in Iso-Inclination Geometry: Ideal for studying crystallographic textures in polycrystalline materials, providing insights into material properties and processing effects.
- Determination of Crystal Orientation: Ensures precise alignment for determining the crystallographic orientation of single crystals, critical for materials research and quality control.
The stage features high-precision motors and intuitive software integration, allowing for seamless control and automation of complex alignment
procedures. Its robust design accommodates a wide range of sample sizes and shapes, making it a versatile tool for both routine and advanced
analytical applications. By enhancing measurement accuracy and reducing setup time, the two-axis sample stage significantly improves laboratory
efficiency and data quality.
Features:
- Maximum sample mass: 1 kg
- Maximum sample size: 70 mm (width) × 13 mm (height)
- Maximum Z-axis travel: 13 mm
- Minimum Z-axis travel: 0.625 μm
- Minimum rotation step in Phi angle: 0.002°
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