Description
Certified standard samples serve as essential tools for instrument validation and
performance verification in X-ray diffraction analysis. These precisely characterized materials
are specifically designed to evaluate and optimize diffractometer alignment, including:
- Geometric calibration (goniometer radius, zero-angle position)
- Peak position accuracy (2θ angle calibration)
- Instrument resolution (peak width/shape analysis)
- Intensity response (detector linearity verification)
Regular use of these standards ensures measurement reproducibility and validates software
processing algorithms for phase identification, lattice parameter calculation, and other
quantitative analyses. The calibration procedure involves comparing measured diffraction
patterns against certified reference data to identify and correct any instrumental deviations.
This quality control practice is particularly critical when:
- Commissioning new equipment
- After hardware modifications
- As part of routine maintenance protocols
- Before high-precision measurements
Optional certified reference materials are available for specialized applications like residual
stress analysis or texture measurements.
Reference sample type:
|
SRM 1976 NIST |
Item No. 00.32.303 |
|
SRM 660c NIST |
Item No. 00.96.491 |
|
SRM 675 NIST |
Item No. 00.37.291 |
|
Others |
On request |
Features:
- Reference samples
- Material: SRM 1976 NIST (corundum pellet), SRM 660c NIST (lanthanum hexaboride powder), SRM 675 NIST (synthetic mica powder), etc.
- Solid sample dimensions: 26 mm
- 2 mm thickness
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