Description
The slit is intended for forming a small, low-divergence radiation beam.
Alignment slits are used to:
- Precisely define the X-ray beam geometry – control beam size, divergence, and direction for accurate measurements
- Optimize instrument alignment – help calibrate the diffractometer by refining the beam path (e.g., during initial setup or maintenance)
- Reduce parasitic scattering – minimize background noise by blocking stray radiation
- Ensure reproducibility – maintain consistent beam conditions for reliable results across experiments
Key applications:
- Initial diffractometer alignment
- Beam conditioning for high-resolution measurements
- Grazing-incidence (GIXRD) and micro-diffraction setups
Features:
- Plates material: tantalum, brass
- Distance between plates: 50 μm
- Installed on the X-ray source arm
- Simple installation and replacement
Contact us
The fastest way to hear back from us is to fill the contact form below. Our appropriate department will get back to you depending on your inquiry as soon as possible.