Description
The cuvette is designed for high-precision measurements of small sample quantities. It
features background-free diffraction plates crafted from a silicon monocrystal with a
specific orientation, ensuring minimal interference.
This makes it ideal for powder X-ray diffractometry applications where reducing
background noise and unwanted peaks is critical, particularly within the 20 to 120
degrees 2θ range. Its design ensures accurate and reliable results, making it a valuable
tool for advanced analytical studies.
Cuvette type:
|
Background-free cuvette with a flat bottom |
Item No. 126.33.075 |
|
Background-free cuvette with a recess of 12 mm diameter and 0.5 mm depth |
Item No. 126.33.073 |
|
Others |
On request |
Features:
- Circular shape, 25 mm diameter, 1 mm thickness
- Material: silicon monocrystal
- Two makes: with and without recess
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