Filter for diffracted beam (Kβ filter)

Filter for diffracted beam (Kβ filter)
LOT #X1001 | Designed for R. The appropriate material and filter thickness are selected depending on the X-ray tube anode material and required degree of Kβ suppression.
LV Analytical Accessories Filter for diffracted beam

Description

One of the key factors for obtaining reliable statistical information during an experiment is a sample preparation. A properly prepared powdered sample is a number of crystallites not more than 10 μm, arranged in a random manner. Large crystallite sizes, as well as their non-random orientation lead to changes in the intensity of the peaks. As a result, obtained diffraction patterns do not correspond to the reference images presented in the database.

Mills, mortars, testing sieves are widely used for powdered sample preparation.

Kβ filter material 0,025 mmNo.
Ni (29Cu tube)Item No. 04.03.102-01
Fe (27Co tube)Item No. 04.03.102-02
Mn (26Fe tube)Item No. 04.03.102-03
V (24Cr tube)Item No. 04.03.102-04
Zr (42Mo tube)Item No. 04.03.102-05
Another makeOn request

Features:

  • Installed on the detector arm
  • Filter material (for corresponding X-ray tube anode material): V (Cr), Fe (Co), Mn (Fe), Ni (Cu), Zr (Mo)
  • Filter thickness: from 0,015 up to 0,200 mm
  • Simple installation and replacement

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